產(chǎn)品詳情
2020年7月30日布魯克推出了ZUI新一代超高速原子力顯微鏡NanoRacer®。NanoRacer®憑借其50幀/秒的超高速成像，實(shí)現(xiàn)了真正意義上視頻級(jí)成像速度下單個(gè)生物分子的動(dòng)態(tài)觀察。NanoRacer®的革新性的技術(shù)突破，在AFM發(fā)展史上樹(shù)立了新的里程碑。布魯克BioAFM研發(fā)團(tuán)隊(duì)與生命科學(xué)領(lǐng)域的專家緊密合作，使NanoRacer®不僅擁有超高掃描速率與原子級(jí)別分辨率，而且擁有杰出的易用性，使得對(duì)單分子動(dòng)態(tài)過(guò)程的捕捉變得十分便捷，為深入理解生物物理、生物化學(xué)、分子生物學(xué)、病毒學(xué)以及生物醫(yī)學(xué)等領(lǐng)域的單分子動(dòng)態(tài)過(guò)程提供了強(qiáng)大工具。
全新的NanoRacer®采用了新的架構(gòu)結(jié)合更低噪音、更高穩(wěn)定性的Vortis? 2控制器，全新的驅(qū)動(dòng)算法與力控制算法，可以在超高速下獲取高分辨的生物樣品信息。新系統(tǒng)整合了基于工作流程的V7操作軟件，直觀的用戶界面與流程化、自動(dòng)化的設(shè)置使得研究人員可以專注于自己的實(shí)驗(yàn)，加速高端研究的產(chǎn)出能效。
Specifications
Maximum scan speed of up to 50 frames/sec with 100 ×100 nm2 scan range and 10 k pixels
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Atomic defect resolution in closed-loop
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Designed for medium to small sized cantilevers for lowest forces and highest scan speeds
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Ultra-low noise cantilever-deflection detection system
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IR cantilever-deflection detection light source with small spot size
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Optional photothermal cantilever drive. 730 nm wavelength ensures minimal sample interb compared to blue-light excitation
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Highest detector bandb of 8 MHz for high speed signal capture
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Automated laser and detector alignment
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Scanner unit
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2 × 2 × 1.5 μm3 scan range
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Sensor noise level < 0.09 nm RMS in xy
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0.04 nm RMS sensor noise level in z
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Highest resonance frequency for z axis of >180 kHz
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Typical sample size 4 mm diameter
Control electronics
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Vortis 2 Speed controller: State-of-the-art, digital controller with lowest noise levels and highest flexibility
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Newly designed, high-voltage power amplifier drives the scanner unit
New workflow-based V7 SPMControl software
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True multi-user platb, ideal for imaging facilities
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User-programmable software
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AutoAlignment and setup
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Advanced feedback algorithms
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Fully automated sensitivity and spring constant calibration using thermal noise or Sader b
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Improved ForceWatch? and TipSaver? mode for force spectroscopy and imaging
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Advanced spectroscopy modes, e.g. various force clamp modes or ramp designs
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Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.
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Powerful batch processing of force curves and images, including WLC, FJC, step-fitting, JKR, DMT model and other analyses
